The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Sep. 14, 2023
Micron Technology, Inc., Boise, ID (US);
Binbin Huo, Taufkirchen, DE;
Olivier Duval, Hudson, NH (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Methods, systems, and devices for host system diagnostic testing are described. A diagnostic tool including a diagnostic executable stored to an external memory may evaluate a system including a host subsystem and a memory subsystem. Upon initialization, the diagnostic executable may configure trace points in one or more layers (e.g., associated with an operating system) of the host subsystem based on dependencies (e.g., libraries) stored to the external memory, and may receive, from the host subsystem, first data collected at the trace points, directly from a host system buffer, or from the memory subsystem. Concurrent to the collection procedure, the diagnostic executable may perform processing operations on the first data to generate second data, which may be associated with one or more metrics of system performance. The second data is stored to the external memory, and may be utilized to evaluate the system.