The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Dec. 29, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Kyungjin Kim, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/073 (2013.01);
Abstract

Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to detect erroneous empty pages. The controller detects a read error associated with reading data from a set of memory components in accordance with an individual read level of a plurality of read levels. In response to detecting the read error, the controller computes one or more check failure unit count values corresponding to the individual read level. The controller compares the one or more check failure unit count values to a threshold value and determines whether the read error corresponds to an empty page read error based on a result of comparing the one or more check failure unit count values to the threshold value.


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Kim, Kyungjin. (2026). Empty page detection (U.S. Patent No. 12591476). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12591476

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