The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Sep. 08, 2023
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Zhu Wen, Beijing, CN;

Xiong Bin Liao, Beijing, CN;

Li Cao, Beijing, CN;

Zi Quan Bai, Beijing, CN;

Sheng Qi Zhang, Beijing, CN;

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4008 (2013.01); G01R 29/10 (2013.01);
Abstract

A system is provided for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT). The system includes multiple antenna elements arranged in an array, where the antenna elements include antennas and diodes coupled to the antennas, respectively. Each antenna has a radar cross-section (RCS) that is too small for the antenna elements to operate in a reflect mode. Each diode is zero biased, such that the diodes receive the incident RF signal through the antennas to which the diodes are respectively coupled, and rectify the incident RF signal to DC voltages that are proportional to power of the incident RF signal, enabling the antenna elements to operate in a detect mode.


Find Patent Forward Citations

Wen, Zhu. (2026). Rectenna array for detecting power radiated pattern of microwave or millimeter-wave signals (U.S. Patent No. 12591039). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12591039

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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