The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jan. 06, 2022
Anritsu Corporation, Atsugi, JP;
Takeshi Yamazaki, Atsugi, JP;
Takashi Kanai, Atsugi, JP;
ANRITSU CORPORATION, Atsugi, JP;
Abstract
An X-ray inspection apparatus includes: a transportation unit that transports an object through an inspection area; an X-ray generation source; an X-ray detection unit; an image data generation unit that generates image data from an output of the X-ray detection unit; a good or not determination unit that performs quality inspection of the object based on the generated image data and a predetermined criterion; and a control unit that controls the inspection, wherein the control unit switches between an inspection mode and a calibration mode in which calibration data for bringing into uniformity the brightness of the image is generated. The control unit includes a calibration data generation unit that generates calibration data based on image data generated before and after a calibration member is inspected in the calibration mode, and a correction unit that corrects the image data of the object, based on the calibration data.
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