The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Jul. 19, 2023
Applicant:

Shanghai Huali Integrated Circuit Corporation, Shanghai, CN;

Inventors:

Hongzhu Zheng, Shanghai, CN;

Jian Wang, Shanghai, CN;

Yunqing Dai, Shanghai, CN;

Wenzhan Zhou, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01); H10D 84/85 (2025.01);
U.S. Cl.
CPC ...
H01L 21/02186 (2013.01); H01L 21/0228 (2013.01); H10D 84/0193 (2025.01); H10D 84/038 (2025.01); H10D 84/85 (2025.01);
Abstract

The present application provides a method for fabricating multiple work function layers, including: forming the first to the nth transistor gates with notches; forming a blocking layer in the notches; depositing the first work function layer and removing the first work function layer on the first to the (n−1)th transistor gates; depositing a second work function layer; removing the second work function layer on the first to the (n−2)th transistor gates; depositing a third work function layer on the blocking layer on the first to the (n−2)th transistor gates and the second work function layer on the (n−1)th and nth transistor gates; removing the third work function layer on the first to (n−3)th transistor gates; depositing the third to the (n−1)th work function layers by analogy until only the blocking layer exists on the last transistor gate, herein the thickness of the third to the (n−1)th work function layers decreases sequentially and gradually.


Find Patent Forward Citations

Zheng, Hongzhu. (2026). Method for fabricating multiple work function layers (U.S. Patent No. 12588442). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12588442

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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