The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Aug. 21, 2023
Applicant:

Disco Corporation, Tokyo, JP;

Inventor:

Satoshi Kobayashi, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 52/00 (2026.01); B23K 26/38 (2014.01); B23K 26/53 (2014.01); H10P 34/42 (2026.01); H10P 90/00 (2026.01); H10W 10/10 (2026.01);
U.S. Cl.
CPC ...
H10P 52/00 (2026.01); B23K 26/38 (2013.01); B23K 26/53 (2015.10); H10P 34/42 (2026.01); H10P 90/1914 (2026.01); H10W 10/181 (2026.01);
Abstract

A wafer is processed by causing a cutting blade to cut into an outer circumferential surplus region of a first wafer from the front surface side by a predetermined thickness and executing cutting along the outer circumferential edge to form an annular step part in the outer circumferential surplus region, bonding the front surface side of the first wafer and the front surface side of a second wafer to form a bonded wafer, forming an annular modified layer by positioning the focal point of a laser beam with a wavelength having transmissibility with respect to the first wafer to the inside of the first wafer and executing irradiation with the laser beam along the boundary between a device region and the outer circumferential surplus region from the back surface side, and grinding the back surface side of the first wafer to execute thinning to a predetermined finished thickness.


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