The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Sep. 25, 2023
Applicant:

University of Science and Technology of China, Hefei, CN;

Inventors:

Jingyang Zhou, Hefei, CN;

Kangwei Xia, Hefei, CN;

Ya Wang, Hefei, CN;

Jiangfeng Du, Hefei, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/26 (2006.01);
U.S. Cl.
CPC ...
G11B 7/268 (2013.01);
Abstract

A method for storing and acquiring information using fluorescence defects in wide bandgap materials, a device, an apparatus and a storage medium are provided, which are applied to a field of optical information storage technology. The method includes: determining a processing parameter group, where the processing parameter group is configured to store target information into wide bandgap materials, and the processing parameter group comprises at least one processing parameter; performing a processing at M storage addresses of the wide bandgap materials based on the processing parameter group, so that fluorescence defects matching the target information are generated at the M storage addresses, where M is a positive integer.


Find Patent Forward Citations

Loading…