The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Jan. 20, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Yang Liu, San Jose, CA (US);
Zhongguang Xu, San Jose, CA (US);
Murong Lang, San Jose, CA (US);
Fangfang Zhu, San Jose, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0614 (2013.01); G06F 3/0679 (2013.01);
Abstract
One or more media scan parameters associated with a memory device are maintained. A number of program erase cycles associated with the memory device is identified. Responsive to determining that the number of program erase cycles satisfies a criterion, one or more adjusted media scan parameters are generated by adjusting the one or more media scan parameters. A media scan of the memory device is performed according to the one or more adjusted media scan parameters.