The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Oct. 16, 2023
Applicant:

Gigaphoton Inc., Tochigi, JP;

Inventor:

Takuma Yamanaka, Oyama, JP;

Assignee:

Gigaphoton Inc., Tochigi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/08 (2023.01); G01J 3/00 (2006.01); G01J 3/45 (2006.01); G03F 7/00 (2006.01); H01S 3/13 (2006.01); H01S 3/137 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G03F 7/70025 (2013.01); G03F 7/70575 (2013.01); H01S 3/08086 (2013.01); H01S 3/1305 (2013.01); H01S 3/137 (2013.01); G01J 2003/003 (2013.01);
Abstract

A wavelength measurement apparatus includes a first spectrometer that has a first free spectral range and generates a first measured waveform from an interference pattern produced by a pulse laser beam, a second spectrometer that has a second free spectral range narrower than the first free spectral range and generates a second measured waveform from the interference pattern produced by the pulse laser beam, and a processor that reads data on a first measurement range of the first spectrometer, sets a second measurement range of the second spectrometer based on the data on the first measurement range, reads data on the second measurement range, and calculates a center wavelength of the pulse laser beam based on the data on the first measurement range and the data on the second measurement range.


Find Patent Forward Citations

Yamanaka, Takuma. (2026). Wavelength measurement apparatus, narrowed-line laser apparatus, and method for manufacturing electronic devices (U.S. Patent No. 12571680). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12571680

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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