The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Sep. 28, 2022
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract
A computer-implemented method for instance segmentation of at least one microscope image showing a plurality of objects, comprising: calculating positions of object centers of the objects in the microscope image; determining which image areas of the microscope image are covered by the objects; calculating Voronoi regions using the object centers as Voronoi sites; and determining an instance segmentation mask by separating the image areas covered by the objects into different instances using boundaries of the Voronoi regions.