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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12566354 B1

PDFFull Text
Date of Patent:
Mar. 03, 2026

Filed:

Oct. 01, 2020

Measuring method for optical nonlinearity of two-dimensional material

Applicant:

Ntt, Inc., Tokyo, JP;

Inventors:

Yuya Yonezu, Musashino, JP;

Atsushi Ishizawa, Musashino, JP;

Hidetaka Nishi, Musashino, JP;

Tai Tsuchizawa, Musashino, JP;

Nobuyuki Matsuda, Musashino, JP;

Rai Takahashi, Musashino, JP;

Koji Yamada, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:

Workman Nydegger

Primary Examiner:

Catherine T Rastovski

Assistant Examiner:

Sharah undefined Zaab

Int. Cl.
CPC ...
G02F 1/35 (2006.01); G01N 21/41 (2006.01); G02F 1/365 (2006.01);
U.S. Cl.
CPC ...
G02F 1/3526 (2013.01); G01N 21/41 (2013.01); G02F 1/365 (2013.01);
Abstract

An optical nonlinearity measurement method according to the present disclosure utilizes photon pair generation through a spontaneous four-wave mixing process, to observe photon pairs using an optical waveguide loaded with a two-dimensional material. Compared with the Z-scan method, the influence of free carriers on nonlinear refractive indexes is only indirect. With a parameter being the length of the attached two-dimensional material in the optical waveguide direction, a theoretical value of the coincidence rate of the photon pairs based on the coupled wave equation is fitted to a measured value of the coincidence rate of the photon pairs. For the coincidence rate of the photon pairs, the theoretical value based on the coupled wave equation is fitted to the measured value in a state reflecting the structure of the optical waveguide loaded with the two-dimensional material, and nonlinear coefficients γand γat that time are obtained.

Find Patent Forward Citations

Yonezu, Yuya. (2026). Measuring method for optical nonlinearity of two-dimensional material (U.S. Patent No. 12566354). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12566354

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