The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Jun. 10, 2022
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Da-Jun Lin, Kaohsiung, TW;

Fu-Yu Tsai, Tainan, TW;

Bin-Siang Tsai, Changhua County, TW;

Chung-Yi Chiu, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10D 62/85 (2025.01); H01L 21/285 (2006.01); H10D 30/01 (2025.01); H10D 30/47 (2025.01); H10D 64/62 (2025.01);
U.S. Cl.
CPC ...
H10D 62/85 (2025.01); H01L 21/28575 (2013.01); H10D 30/015 (2025.01); H10D 30/4755 (2025.01); H10D 62/8503 (2025.01); H10D 64/62 (2025.01);
Abstract

A method for forming ohmic contacts on a compound semiconductor device is disclosed. A channel layer is formed on a substrate. A barrier layer is formed on the channel layer. A passivation layer is formed on the barrier layer. A contact area is formed by etching through the passivation layer and the barrier layer. The channel layer is partially exposed at a bottom of the contact area. A sacrificial metallic layer is conformally deposited on the contact area. The sacrificial metallic layer is subjected to an annealing process, thereby forming a heavily doped region in the channel layer directly under the sacrificial metallic layer. The sacrificial metallic layer is removed to expose the heavily doped region. A metal silicide layer is formed on the heavily doped region.


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