The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Feb. 19, 2023
Diakopto, Inc., San Jose, CA (US);
Maxim Ershov, San Jose, CA (US);
Vitaliy Schetinin, Warsaw, PL;
ANSYS, INC., Canonsburg, PA (US);
Abstract
A software tool used to assess and/or simulate an integrated circuit ('IC') layout employs heterogeneous resistance extraction and/or meshing, to combine advantages of a relatively compact parasitics file size and robustness for effective simulation and electrical performance analysis. In one embodiment, filters are automatically applied (or are manually specified by a user) to select structures, layers, geographic regions, nets or other areas of a design which will receive additional extraction and/or meshing scrutiny, with the remainder of the design being subjected to default practices. For example, software can be scripted (or rule driven) to perform 1D meshing for in-layer electrical pathways while providing 2D, 3D, or other complex meshing for vias, contact pads, device instances, selected nets and/or other structures. Techniques can be applied for reassessing impact of structural redesign, and reports and/or visualization can be generated, each enhanced by the use of heterogeneous meshing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile