The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Sep. 25, 2023
Applicant:

Illumina, Inc., San Diego, CA (US);

Inventors:

Yu Chen, Irvine, CA (US);

Gregory Holst, San Diego, CA (US);

John Earney, San Diego, CA (US);

Patrick Wen, Encinitas, CA (US);

Chia-Hsi Liu, San Diego, CA (US);

Daeyong Sim, San Diego, CA (US);

Assignee:

ILLUMINA, INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/67 (2023.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
H04N 23/675 (2023.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G06V 10/761 (2022.01);
Abstract

Some implementations of the disclosure relate to an imaging system including one or more image sensors and a Z-stage. The imaging system is configured to perform operations including: capturing, using the one or more image sensors, a first image of a first pair of spots projected at a first sample location of a sample; determining whether or not the first image of the first pair of spots is valid; and when the first image is determined to be valid: obtaining, based on the first image, a current separation distance measurement of the first pair of spots; and controlling, based at least on the current separation distance measurement, the Z-stage to focus the imaging system at the first sample location.


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