The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Sep. 20, 2022
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Somnath Kundu, Hillsboro, OR (US);

Amy L. Whitcombe, Saratoga, CA (US);

Stefano Pellerano, Beaverton, OR (US);

Peter Sagazio, Portland, OR (US);

Brent Carlton, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/12 (2006.01); H04B 1/40 (2015.01);
U.S. Cl.
CPC ...
H03M 1/1014 (2013.01); H04B 1/40 (2013.01);
Abstract

An analog-to-digital converter, ADC, is provided. The ADC comprises multiple time-interleaved sub-ADCs, a detection circuit, and a calibration circuit. The sub-ADCs are configured to, when the ADC is in a calibration mode, generate a first signal by sampling a calibration signal based on a first clock signal and at least a second clock signal. The first clock signal comprises a phase shift relative to the second clock signal. The calibration circuit is configured to determine a first mismatch between the phase shift and a phase shift threshold based on the first signal. The detection circuit is configured to, when the ADC is in an operation mode, generate a second signal by sampling one of a biased signal to be received by the sub-ADCs or a second calibration signal based on at least one of the first clock signal and the second clock signal. The calibration circuit is configured to determine a second mismatch between the phase shift and the phase shift threshold based on the second signal and calibrate the ADC based on the first and the second mismatch.


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