The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Oct. 27, 2022
Applicant:

Jeol Ltd., Tokyo, JP;

Inventors:

Shinichi Mukousaka, Tokyo, JP;

Junkei Kou, Tokyo, JP;

Kiyotaka Konuma, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); H01J 49/00 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
H01J 49/10 (2013.01); H01J 49/0031 (2013.01); H01J 49/4215 (2013.01);
Abstract

Ions ejected from a collision cell are detected by a detector. An evaluation unit generates a temporary calibration curve based on an intensity of a detection signal and evaluates an ion accumulation time of the collision cell based on the temporary calibration curve. When the evaluation unit determines signal saturation, the ion accumulation time of the collision cell is reduced. When the evaluation unit determines sensitivity insufficiency, the ion accumulation time of the collision cell is increased.


Find Patent Forward Citations

Quick Actions:

Mukousaka, Shinichi. (2026). Mass spectrometry apparatus and mass spectrometry method for adjusting ion accumulation times based on detection intensity (U.S. Patent No. 12555762). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12555762

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…