The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Oct. 05, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zöllnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G02B 21/367 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01);
Abstract
A microscopy system comprises a microscope configured to capture an overview image and a computing device comprising a model trained for image segmentation, which calculates a segmentation mask based on the overview image. The computing device adjusts a pattern described by a parameterized model to the segmentation mask. An updated segmentation mask is generated using the adjusted pattern.