The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Dec. 20, 2023
Applicant:

Mitutoyo Corporation, Kanagawa-ken, JP;

Inventor:

Ted Staton Cook, Kirkland, WA (US);

Assignee:

MITUTOYO CORPORATION, Kanagawa-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/20 (2006.01);
U.S. Cl.
CPC ...
G01D 5/20 (2013.01);
Abstract

A measuring instrument includes a movable portion configured to rotate in an arc motion about a pivot portion, and an electronic position encoder configured to measure an absolute relative position between a detector portion and a scale portion, one of which forms part of the movable portion. In the detector portion, first and second scale element portions of first and second track portions are arc-shaped and parallel to each other. In the scale portion, first signal modulating scale elements are disposed along a first scale element portion according to a first signal modulating element angular spatial step θand second signal modulating scale elements are disposed along a second scale element portion according to a second signal modulating element angular spatial step θthat is different than the first signal modulating element angular spatial step θ.


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