The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Oct. 15, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Nana Jumonji, Tokyo, JP;

Yosuke Kimura, Tokyo, JP;

Chisato Sugawara, Tokyo, JP;

Takakazu Ishii, Tokyo, JP;

Shouhei Ohno, Tokyo, JP;

Hiromichi Hirata, Tokyo, JP;

Daisuke Hashizume, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E01C 23/01 (2006.01); G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
E01C 23/01 (2013.01); G01S 13/9005 (2013.01); G01S 13/9027 (2019.05);
Abstract

A deterioration determination device includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: acquiring a diagnosis result of first deterioration of a structure and a determination result of displacement of a ground surface including the structure; determining second deterioration of the structure using the diagnosis result of the first deterioration and the determination result of the displacement of the ground surface; and outputting the second deterioration and a position of the second deterioration.


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