The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Oct. 17, 2023
Applicant:

Sinfonia Technology Co., Ltd., Tokyo, JP;

Inventors:

Keigo Sato, Tokyo, JP;

Yuji Miyashita, Tokyo, JP;

Katsumi Yasuda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/45 (2023.01); G06T 7/00 (2017.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H04N 23/45 (2023.01); G06T 7/0004 (2013.01); H01L 21/67265 (2013.01); G06T 2207/30148 (2013.01);
Abstract

The load port includes a FOUP configured to accommodate a plurality of substrates in multiple stages, cameras configured to image each of the substrates accommodated in the FOUP and including a low-magnification camera with a wide horizontal angle of view and a high-magnification camera with a narrow horizontal angle of view, and a CPU configured to detect the accommodation state of each of the substrates based on the imaging data acquired from the low-magnification camera and the high-magnification camera, respectively.


Find Patent Forward Citations

Sato, Keigo. (2026). Mapping device and substrate accommodation state determination method (U.S. Patent No. 12549835). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12549835

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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