The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Nov. 01, 2022
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
Maarten Bischoff, Uden, NL;
Ondřej Ludmil Sháněl, Brno, CZ;
Assignee:
FEI Company, Hillsboro, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 37/26 (2013.01); H01J 2237/2003 (2013.01); H01J 2237/204 (2013.01);
Abstract
Systems and methods for transferring a sample from a transmission electron microscope (TEM) column are described herein. In one aspect, a method can include transferring a sample positioned in a holder capsule of a TEM sample holder from a vacuum chamber of a TEM into a load lock of the TEM; filling the load lock with a protecting gas; sealing the holder capsule of the TEM sample holder under the protecting gas; and removing the TEM sample holder from the load lock.