Testing for memory devices using dedicated command and address channels

Abstract

Methods, systems, and devices for improved testing for memory devices using dedicated command and address (CA) channels are described. A memory system associated with the memory devices may include a buffer configured to store a channel select indicator that indicates which CA channel to be utilized for various access commands associated with the memory devices. The memory system may utilize headers to facilitate the data transfers between the associated memory devices and testing system via the indicated CA channel using the buffer. The memory system may detect a select chip enable command on the CA channel and may subsequently store the channel select indicator in the buffer. The memory system may then detect data on the dedicated CA channel and subsequently read the stored channel select indicator from the buffer. The memory system may then erase the channel select indicator from the buffer, after receiving a select chip terminate command.