The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Feb. 27, 2024
Fanuc Corporation, Yamanashi, JP;
Hsien-Chung Lin, Fremont, CA (US);
Yongxiang Fan, Union City, CA (US);
Tetsuaki Kato, Fremont, CA (US);
FANUC CORPORATION, Yamanashi, JP;
Abstract
An object interference checking technique using point sets which uses CAD models of objects and obstacles and converts the CAD models to 3D points. The 3D point locations are updated based on object motion. The 3D points are then converted to 3D grid space indices defining space occupied by any point on any object or obstacle. The 3D grid space indices are then converted to 1D indices and the 1D indices are stored as a set per object and per position. Swept volumes for an object are created by computing a union of the 1D index sets across multiple motion steps. Interference checking between objects is performed by computing an intersection of the 1D index sets for a given motion step or position. The 1D indices are converted back to 3D coordinates to define the 3D shapes of the swept volumes and interferences.