The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Jul. 20, 2022
Applicants:

Suzhou Everbright Photonics Co., Ltd., Jiangsu, CN;

Everbright Institute of Semiconductor Photonics Co., Ltd., Jiangsu, CN;

Inventors:

Jun Wang, Suzhou, CN;

Shaoyang Tan, Suzhou, CN;

Lichen Zhang, Suzhou, CN;

Yiwen Hu, Suzhou, CN;

Wu Zhao, Suzhou, CN;

Bo Li, Suzhou, CN;

Quanling Li, Suzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/042 (2006.01); H01S 5/20 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0421 (2013.01); H01S 5/04254 (2019.08); H01S 5/2018 (2013.01); H01S 5/2086 (2013.01); H01S 5/04256 (2019.08); H01S 5/209 (2013.01);
Abstract

A high-reliability low-defect semiconductor light-emitting device and a method for manufacturing same. The high-reliability low-defect semiconductor light-emitting device includes: a semiconductor substrate layer; an active layer arranged on the semiconductor substrate layer; a doped semiconductor contact layer arranged on a side of the active layer away from the semiconductor substrate layer, where the doped semiconductor contact layer includes a first area and an edge area surrounding the first area; a protection layer arranged on a side of the edge area of the doped semiconductor contact layer away from the active layer; and a front electrode layer, arranged on a side of the first area away from the active layer, where an upper surface of the front electrode layer in the first area is lower than an upper surface of the protection layer. The semiconductor light-emitting device has both high reliability and reduced process control costs.


Find Patent Forward Citations

Wang, Jun. (2026). High-reliability low-defect semiconductor light-emitting device and method for manufacturing same (U.S. Patent No. 12542416). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12542416

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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