The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2026
Filed:
Jul. 31, 2024
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Sean Brasfield, Boise, ID (US);
Chong Giap Chiew, San Jose, CA (US);
Tawalin Opastrakoon, Boise, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 16/04 (2006.01); G11C 16/26 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50004 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01); G11C 2029/5004 (2013.01);
Abstract
Various embodiments provide for performing a read voltage level calibration process with selective skipping collection of calibration-related information on a memory device of a memory system, such as a memory sub-system. For example, some embodiments provide for performing a coarse threshold estimate (CTE) calibration process, with selective skipping of failed bit count (CFBit) information collection, on a memory system.