The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Sep. 23, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Gaurav Porwal, Portland, OR (US);

Theodros Yigzaw, Sherwood, OR (US);

Subhankar Panda, Portland, OR (US);

John Holm, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 13/40 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0706 (2013.01); G06F 11/076 (2013.01); G06F 11/0787 (2013.01); G06F 13/4068 (2013.01);
Abstract

Methods and apparatus relating to lane based normalized historical error counter view for faulty lane isolation and disambiguation of transient versus persistent errors are described. In an embodiment, a plurality of storage entries store error information to be detected at one or more physical lanes of an interface. Faulty lane detection logic circuitry determines which of the one or more physical lanes is faulty or more likely to be faulty based at least in part on the stored error information for the one or more physical lanes of the interface. The stored error information comprises historical error details for the one or more physical lanes of the interface. Other embodiments are also disclosed and claimed.


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