The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2026
Filed:
Mar. 08, 2023
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hansung Ryu, Suwon-si, KR;
Haksung Kim, Seoul, KR;
Gyunghwan Oh, Suwon-si, KR;
Heonsu Kim, Seoul, KR;
Dongwoon Park, Seoul, KR;
Jeonghyeon Baek, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
IUCF-HYU (Industry-University Cooperation Foundation Hanyang University), Seoul, KR;
Abstract
An apparatus for measuring properties of a thermosetting polymer includes a body having a first chamber and a second chamber each filled with the thermosetting polymer material. A first FBG sensor is disposed in the polymer material within the first chamber and a second FBG sensor is disposed in the polymer material within the second chamber. A first dielectric constant sensor is in the first chamber, and a second dielectric constant sensor is in the second chamber. A computing device is configured to measure properties of the thermosetting polymer based on wavelength data measured using the first FBG sensor and the second FBG sensor, and a loss coefficient of the polymer material measured using the first dielectric constant sensor and the second dielectric constant sensor, while the thermosetting polymer solidifies in the first chamber and the second chamber.