The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Oct. 03, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Chang Zhang, Santa Clara, CA (US);

Jian J. Chen, Fremont, CA (US);

Quoc Truong, San Ramon, CA (US);

Jamie Stuart Leighton, Palo Alto, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/12 (2006.01); B24B 37/005 (2012.01); G01F 1/661 (2022.01);
U.S. Cl.
CPC ...
B24B 49/12 (2013.01); B24B 37/005 (2013.01); G01F 1/661 (2013.01);
Abstract

A polishing system includes a pressure system, a substrate carrier including a membrane, a first sensor, and a control system. A first compartment of the membrane is fluidly coupled to the pressure system. The first sensor is configured to monitor the pressure system and produce a first output based on conditions detected in the pressure system. The control system coupled to the first sensor and configured to process the first output to produce a first processed output, and the control system configured to compare the first processed output to a threshold to detect a presence of a fluid in the pressure system.


Find Patent Forward Citations

Zhang, Chang. (2026). System and method for detecting a membrane failure in a chemical mechanical polishing system (U.S. Patent No. 12539577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12539577

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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