The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Mar. 27, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Hanping Chen, San Jose, CA (US);

Zhongguang Xu, San Jose, CA (US);

Christina Papagianni, San Jose, CA (US);

Yu-Chung Lien, San Jose, CA (US);

Zhenming Zhou, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/34 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3459 (2013.01); G11C 16/102 (2013.01); G11C 29/52 (2013.01);
Abstract

A defective portion of a block of a memory device is identified. The defective portion of the block is programmed with a pre-programming voltage pattern. The pre-programming voltage pattern is programmed to the defective portion of the block before a programming operation is performed on a non-defective portion of the block. A verification operation is caused to be performed on the defective portion of the block.


Find Patent Forward Citations

Chen, Hanping. (2026). Half good block handling with defective deck pre-programing in a memory sub-system (U.S. Patent No. 12537068). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12537068

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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