The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jul. 07, 2023
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Abhijith Prakash, Milpitas, CA (US);

Xiang Yang, Santa Clara, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G06F 3/06 (2006.01); G11C 16/04 (2006.01); G11C 16/08 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G06F 3/0619 (2013.01); G06F 3/0658 (2013.01); G06F 3/0679 (2013.01); G11C 16/0483 (2013.01); G11C 16/08 (2013.01);
Abstract

A method for performing a read operation of a fully programmed non-volatile memory that, initially, was partially programmed, the method comprising: selecting a word line within an initially programmed portion; applying a read to the selected word line, determining a first 'optimal' read verify voltage level for each program state; once fully programmed, applying a read to the selected word line, determining a second “optimal” read verify voltage level for each program state; for each program state, determining a difference between the first “optimal” read verify voltage level and the second “optimal” read verify voltage level, the difference defining a supplemental offset value; determining an “optimal” read verify voltage level for each program state by applying the supplemental offset value in conjunction with an initial offset value defined in a pre-calibrated “lookup” table; and applying a read to each word line according to each determined “optimal” read verify voltage level.


Find Patent Forward Citations

Loading…