The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jul. 27, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seongmuk Kang, Suwon-si, KR;

Yeonggeol Song, Suwon-si, KR;

Kijun Lee, Suwon-si, KR;

Myungkyu Lee, Suwon-si, KR;

Kyomin Sohn, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 29/42 (2006.01); G11C 29/52 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/1016 (2013.01); G06F 11/1048 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); H03M 13/1525 (2013.01); H03M 13/153 (2013.01); H03M 13/1545 (2013.01); H03M 13/1575 (2013.01);
Abstract

A memory device includes a memory cell array that includes a plurality of memory cells disposed in a plurality of rows, an eraser detector that stores vulnerable row data including a location of an estimation error corresponding to a vulnerable row among the plurality of rows, an error correction code (ECC) engine that decodes first data read from the memory cell array based on the vulnerable row data to generate information on a first error included in the first data in response to a read command and corrects the first error to generate second data, and a flag generator that generates a decoding flag indicating a decoding state of the ECC engine based on the vulnerable row data, the information on the first error, and the second data.


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