The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

May. 15, 2023
Applicant:

Disco Corporation, Tokyo, JP;

Inventors:

Keiji Nomaru, Tokyo, JP;

Nobuyuki Kimura, Tokyo, JP;

Kentaro Odanaka, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/78 (2006.01); B23K 26/067 (2006.01); B23K 26/073 (2006.01); B23K 26/364 (2014.01); B23K 26/402 (2014.01); H01L 21/268 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 21/78 (2013.01); B23K 26/0676 (2013.01); B23K 26/073 (2013.01); B23K 26/364 (2015.10); B23K 26/402 (2013.01); H01L 21/268 (2013.01); H01L 21/67092 (2013.01);
Abstract

A laser applying apparatus includes a beam spot shaper for shaping a spot of a laser beam into a slender spot and orienting the polarization direction of a linearly polarized laser beam of the laser beam along a longer side of the slender spot, and a spot control unit for positioning a P-polarized laser beam on slanted surfaces of a recess that is formed in a wafer by orienting the longer side of the slender spot transversely across projected dicing lines and for orienting a shorter side of the slender spot in a processing direction along the projected dicing lines. A method of processing a wafer includes a functional layer removing step that is a step of removing a functional layer on a semiconductor substrate of the wafer by applying laser beams to the projected dicing lines with the use of the laser applying apparatus. The functional layer removing step is carried out a plurality of times to remove the functional layer on the projected dicing lines.


Find Patent Forward Citations

Loading…