The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Aug. 27, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Aaron Boehm, Boise, ID (US);

Jeremy Chritz, Seattle, WA (US);

Tamara Schmitz, Scotts Valley, CA (US);

David Hulton, Seattle, WA (US);

Max Vohra, Seattle, WA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 3/06 (2006.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 3/0622 (2013.01); G06F 3/0632 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01); G06F 2221/034 (2013.01);
Abstract

Methods, systems, and devices for measuring change in a channel characteristic to detect a memory device attack are described. A system, such as a vehicle system, may include a host device coupled with a memory device. The host device may transmit a first signal to the memory device and may receive, from the memory device, a second signal as feedback based on the first signal. The host device may determine a channel characteristic, such as a channel impedance measurement, based on the second signal received from the memory device. If the determined channel characteristic fails to satisfy a threshold (e.g., if the measured channel impedance fails to satisfy a reference value within a tolerance range), the host device may detect a potential attack on the memory device and may take corrective action, such as disabling one or more features of the memory device.


Find Patent Forward Citations

Boehm, Aaron. (2026). Measuring change in a channel characteristic to detect memory device attack (U.S. Patent No. 12530448). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530448

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…