The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

May. 16, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Jay Sarkar, San Jose, CA (US);

Vamsi Pavan Rayaprolu, Santa Clara, CA (US);

Ipsita Ghosh, Kolkata, IN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0611 (2013.01); G06F 3/0629 (2013.01); G06F 3/0679 (2013.01);
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including sending, to a device that provides error-handling flow optimization, an ordered set of error-handling operations to be performed to recover data residing in a segment of the memory device; receiving, from the device that provides the error-handling flow optimization, a reordered set of error-handling operations, wherein the reordered set adjusts an order of one or more error-handling operations of the ordered set of error-handling operations, wherein the reordered set is obtained by applying the ordered set of error-handling operations to a trained machine learning model, wherein the trained machine learning model is based on latency data for previously-performed error-handling operations, and wherein the latency data for the previously-performed error-handling operations depends on a workload of the segment of the memory device; and performing one or more error-handling operations of the reordered set of error-handling operations to the data residing in the segment of the memory device.


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