The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Mar. 02, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Christophe Laurent, Agrate Brianza, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/42 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01);
Abstract

Operating an array of memory cells can include storing user data in memory cells of the memory array, storing parity data associated with the user data in a number of parity cells of the memory array, the parity data corresponding to selectable Error Correction Code (ECC) correction capabilities from a minimum ECC correction capability to a maximum ECC correction capability, calculating an ECC syndrome from the stored user data and parity data, based on the ECC syndrome, determining a number of errors in the data, and, based on the determined number of errors, selecting an ECC correction capability of the plurality of ECC correction capabilities. Related memory devices and systems are also herein disclosed.


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