The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Oct. 28, 2022
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Masato Tamura, Santa Clara, CA (US);
Ravigopal Vennelakanti, San Jose, CA (US);
Assignee:
HITACHI, LTD., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G08B 13/196 (2006.01); G06T 7/246 (2017.01); G06V 10/25 (2022.01); G06V 10/74 (2022.01); G06V 20/52 (2022.01); G06V 20/64 (2022.01); G06V 40/10 (2022.01);
U.S. Cl.
CPC ...
G08B 13/19608 (2013.01); G06T 7/246 (2017.01); G06V 10/25 (2022.01); G06V 10/761 (2022.01); G06V 20/53 (2022.01); G06V 20/64 (2022.01); G06V 40/10 (2022.01); G06T 2207/30196 (2013.01); G06T 2207/30232 (2013.01);
Abstract
A method for tracking and monitoring subjects and a plurality of objects. The method may include obtaining an image, wherein the image contains the subjects and the plurality of objects; extracting the subjects and the plurality of objects in the image through first feature extraction; detecting object interactions between the subjects and the plurality of objects; and tracking, through second feature extraction, subject-object pairs having detected object interactions.