The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
May. 09, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Manuel Amthor, Jena, DE;
Daniel Haase, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A number of techniques for assessing simulation models for use in microscopy are provided. In one example technique, a first image (I) of a sample is recorded with a first image recording type, and storing image values of the first image (I) are stored. Based on a simulation model (SM) being applied to the first image (I), a simulated image (I) of a third image recording type of the sample is simulated. A third image (I) of the sample is recorded with a third image recording type. The third image (I) is compared with the simulated image I() of the third image recording type for verification of compliance with previously defined quality criteria, and the simulation model (SM) is classified as permissible when the quality criteria are complied with.