The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Mar. 15, 2024
Applicant:

Qualcomm Technologies, Inc., San Diego, CA (US);

Inventors:

Michael Dorkenwald, Amsterdam, NL;

Yuki Asano, Amsterdam, NL;

Assignee:

QUALCOMM Technologies, Inc., San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/86 (2022.01); G06T 7/73 (2017.01); G06T 11/60 (2006.01); G06V 10/40 (2022.01); G06V 10/774 (2022.01); G06F 40/58 (2020.01);
U.S. Cl.
CPC ...
G06V 10/86 (2022.01); G06T 7/73 (2017.01); G06T 11/60 (2013.01); G06V 10/40 (2022.01); G06V 10/774 (2022.01); G06F 40/58 (2020.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Systems and techniques are described herein for adapting a pretrained machine learning model. For instance, a process can include encoding a training image into a first feature vector, the training image including a first object located at a first location; generating a second feature vector based on a set of sinusoidal functions using a set of weights; combining the first feature vector with a second feature vector to generate a combined feature vector; processing the combined feature vector using a visual language model to obtain a second location for the first object; and adjusting the set of weights based on a comparison between the first location and the second location.


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