The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Jul. 06, 2024
Applicant:

Eliyan Corporation, Santa Clara, CA (US);

Inventor:

Paul Langner, Ottawa, CA;

Assignee:

Eliyan Corp., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 11/102 (2013.01);
Abstract

An integrated circuit (IC) chiplet includes a die-to-die (D2D) interface with a cyclic redundancy check (CRC) decoder to process a received data block of N bits that is appended with a transmit-side CRC-16 checksum. The CRC decoder includes checksum circuitry and storage to store N unique non-zero checksum error values. Each of the N unique non-zero checksum error values represents a predicted checksum error value in the event a given bit location in the received data block of N bits is in error. Match circuitry indicates a match of a generated non-zero error checksum value to one of the N unique non-zero checksum error values in the storage. Repair circuitry corrects the given bit location corresponding to the match.


Find Patent Forward Citations

Langner, Paul. (2026). Die-to-die (d2d) interface with cyclic redundancy check (crc) error correction capability (U.S. Patent No. 12524300). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12524300

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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