The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Feb. 09, 2023
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Thomas Kalkbrenner, Jena, DE;

Jörg Siebenmorgen, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/06 (2013.01);
Abstract

Techniques an apparatuses for localizing objects of a sample that emit detection radiation are disclosed. At least one light sheet is produced in a light sheet plane and a region of the sample to be imaged is illuminated with the light sheet and detection radiation from the sample is spatially resolved in a detection plane. A light sheet is produced that has, in the light sheet plane, a non-illuminated light sheet section delimited by an illuminated light sheet section or is produced sequentially in the light sheet plane, where a non-illuminated light sheet section remains between the sequentially produced light sheets. An object to be localized is present in the non-illuminated region, and a position of the object is captured if it leaves the non-illuminated region and is excited to emit the detection radiation by one of the light sheets delimiting the non-illuminated region.


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