The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Mar. 13, 2023
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G06T 7/11 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01);
Abstract
In a computer-implemented method for determining an orientation of a sample carrier of a microscope, an overview image showing at least a part of a sample carrier with a plurality of sample regions is received. The overview image is evaluated in order to localize predetermined structures. At least one image region that shows at least one predetermined structure is analyzed in order to calculate an orientation indication that discriminates between orientations of the sample carrier that are rotated by 180° relative to each other.