The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Aug. 18, 2022
Applicant:

Bystronic Laser Ag, Niederönz, CH;

Inventors:

Titus Haas, Brittnau, CH;

Andreas Luedi, Burgdorf, CH;

Stefan Wittwer, Herzogenbuchsee, CH;

Assignee:

BYSTRONIC LASER AG, Niederönz, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/08 (2014.01);
U.S. Cl.
CPC ...
B23K 26/0876 (2013.01);
Abstract

In one aspect, the present invention relates to a contour checking device for calculating path deviations from a target path of a cutting head of a laser machine tool. The contour checking device comprises a reference texture interface for reading a reference texture along the target path, which is defined in particular for cutting a contour, a controller, which is intended for controlling the laser machine tool in such a way that the cutting head traverses the target path; at least one camera, wherein the controller for controlling the at least one camera is intended for continuously capturing overlapping frames of the reference texture along the traversed path; a processor, which is intended for executing an image processing algorithm for reconstructing the trajectory traversed by the cutting head from the captured overlapping frames of the reference texture; and wherein the processor is intended for calculating deviations between the reconstruction of the path traversed by the cutting head and the target path. The contour checking device also comprises an output interface, which is intended for outputting the calculated deviations.


Find Patent Forward Citations

Haas, Titus. (2026). Determination of contour fidelity for a laser cutting machine (U.S. Patent No. 12521817). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12521817

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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