The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Apr. 08, 2022
Applicant:

Kenvue Brands Llc, Summit, NJ (US);

Inventors:

Brenda Edison, Skillman, NJ (US);

Thomas Shyr, Skillman, NJ (US);

Neena Tierney, Skillman, NJ (US);

Assignee:

Kenvue Brands LLC, Summit, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
A61B 5/4848 (2013.01); G06T 7/0016 (2013.01); G06T 7/60 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30201 (2013.01);
Abstract

Provided are methods of determining effectiveness of face treatments comprising: providing a front-facing image of the face prior to use of the treatment; identifying a y-axis of the face, wherein the y-axis is defined by a line connecting the center position of the chin of the face through the center of the face; identifying an x-axis of the face, wherein the x-axis is defined by a line that is positioned at a 90-degree angle from the y-axis and goes through the center of the chin of the face; selecting a facial landmark; identifying a facial landmark line, wherein the facial landmark line is defined by a line connecting the center position of the chin of the face to the facial landmark; measuring the angle between the x-axis and the facial landmark line; carrying out the treatment on the face; providing a front-facing image of the face after the treatment.


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