The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Feb. 28, 2022
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Manuel Amthor, Jena, DE;

Daniel Haase, Zoellnitz, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 3/40 (2006.01); G06T 7/00 (2017.01); G06T 7/62 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06V 20/695 (2022.01); G06T 3/40 (2013.01); G06T 7/0012 (2013.01); G06T 7/62 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30242 (2013.01);
Abstract

Processing a microscope image includes forming an input image from a microscope image before the input image is input into an image processing program. The image processing program comprises a learned model for image processing which is trained with training images that show structures with certain image properties. The image processing program calculates an image processing result from the input image. The microscope image is converted into the input image by an image conversion program in such a manner that image properties of structures in the input image are modified with respect to image properties of the structures of the microscope image so that they are closer to the image properties of the structures of the training images.


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