The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Nov. 11, 2021
Beijing Institute of Space Long March Vehicle, Beijing, CN;
Bo Shen, Beijing, CN;
Lei Li, Beijing, CN;
Linka Tang, Beijing, CN;
Xiaofei Wang, Beijing, CN;
Weiyang Song, Beijing, CN;
Jian Tu, Beijing, CN;
Suixue Wang, Beijing, CN;
Chao Dong, Beijing, CN;
Rui Ma, Beijing, CN;
Guodong Liu, Beijing, CN;
Chao Yang, Beijing, CN;
Feng Su, Beijing, CN;
Yongsheng Cheng, Beijing, CN;
Qiang Zhang, Beijing, CN;
Xiaoning Huo, Beijing, CN;
Yichang Gao, Beijing, CN;
Wenwen Si, Beijing, CN;
Longwei He, Beijing, CN;
Weiwei Guan, Beijing, CN;
Ji Li, Beijing, CN;
BEIJING INSTITUTE OF SPACE LONG MARCH VEHICLE, Beijing, CN;
Abstract
A fast calibration test system and method for a phased-array antenna, which belongs to the technical field of antenna measurement, relates to a near-field test system, and relates in particular to the fast calibration and a directional diagram test on a phased-array antenna. The system comprises an upper computer module, a switch module, a synchronization control module, a signal source module, a power amplifier module, a low noise amplifier module, a phased array antenna to be tested, a power supply module, a calibration control module, a scanning module, a signal conditioning module and a vector network module; on the basis of a pulse synchronization mechanism, the loading delay of a wave control code is shortened by using real-time calculation method; the channel calibration of the phased-array antenna under various frequencies may be completed by means of two rounds of scanning, and a directional diagram test on the phased-array antenna under a combination of various frequencies and directional angles may be covered by means of one round of scanning.