The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Aug. 25, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Alex Frolikov, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 3/06 (2006.01); G06F 11/07 (2006.01); G11C 29/38 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G06F 3/0619 (2013.01); G06F 3/0634 (2013.01); G06F 3/0679 (2013.01); G06F 11/0727 (2013.01); G06F 11/076 (2013.01); G06F 11/0793 (2013.01); G11C 29/38 (2013.01);
Abstract

A memory system having non-volatile media and a controller configured to process requests from a host system to store data in the non-volatile media or retrieve data from the non-volatile media. The non-volatile media has a set of memory units. The memory system stores an indicator indicating whether the memory system is operating in a user mode or a manufacturing mode. A defect manager of the memory system identifies a threshold based on the indicator, monitors an error rate in reading data from the non-volatile media and, in response to the error rate reaching the threshold, screens the non-volatile media for defective memory units.


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