The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
May. 09, 2023
Orbotech Ltd., Yavne, IL;
Chay Goldenberg, Tel-Aviv, IL;
Orbotech Ltd., Yavne, IL;
Abstract
A method for 3D imaging of samples using a machine learning algorithm is disclosed. The method uses multimodality focal stacks, which consist of a plurality of images acquired at two or more distances between the sample and a front focal plane, with at least one image acquired using the first modality and additional images acquired using additional modalities. The modalities may have different illumination angles and optionally different spectral distributions. The method may include receiving training images of samples, which include a plurality of training focal stacks, and ground truth 3D data (depth maps) for each training focal stack, and training a machine learning algorithm based on the training images and the ground truth data. The method subsequently receives product images of a sample, the product images including a focal stack from an optical assembly, and generates a 3D depth map.