The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

May. 31, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Chia Wei Chang, Gukeng Township, TW;

Chia Yu Kuo, Hukou Town, TW;

Tzu Ting Tseng, Hsinchu, TW;

Pinhsueh Lai, New Taipei, TW;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01);
Abstract

An example apparatus can include a program component. The program component can program each of a plurality of planes during different time periods subsequent to performing a multi-plane programming on a non-volatile memory array. The program component can monitor a program pulse count for each of the respective plurality of planes per super block. The program component can, in response to the program pulse count for a respective block within one of the plurality of planes being above a threshold pulse count, determine that the respective block is a bad block.


Find Patent Forward Citations

Chang, Chia. (2025). Memory sub-system slow program detection (U.S. Patent No. 12511070). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12511070

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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