The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jun. 01, 2023
Applicant:

Disco Corporation, Tokyo, JP;

Inventor:

Atsushi Ueki, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 31/12 (2006.01); B23K 26/40 (2014.01); B23K 101/40 (2006.01); G01N 21/45 (2006.01); G01N 21/59 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
B23K 31/12 (2013.01); G01N 21/9501 (2013.01); B23K 26/40 (2013.01); B23K 2101/40 (2018.08); G01N 21/45 (2013.01); G01N 21/59 (2013.01);
Abstract

A detection method of resistivity is a detection method of resistivity in which resistivity of a plate-shaped workpiece having a back surface and a front surface on a side opposite to the back surface is detected. The detection method includes an interference waveform acquisition step of irradiating the back surface of the plate-shaped workpiece with light from a light source and acquiring an interference waveform between light reflected by the back surface and light that has been transmitted through the back surface and been reflected by the front surface, and an estimation step of estimating the resistivity of the plate-shaped workpiece on the basis of the interference waveform acquired in the interference waveform acquisition step.


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