The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jun. 24, 2024
Carl Zeiss Microscopy Gmbh, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
Measurement values of a detection channel are corrected, where measurement values are acquired from an arrangement of a plurality of individually readable optical individual detectors, and the measurement values of a selection of the optical individual detectors of the array are assigned to a detection channel. A plurality of optical individual detectors are combined in accordance with a basic pattern to form a respective detection channel and their measurement values are jointly assigned to the detection channel. If at least one defective individual detector is present, the combination in accordance with the basic pattern is cancelled. For the cancelled combination of individual detectors, a changed basic pattern is defined and measurement values of the individual detectors are acquired according to the changed basic pattern. The measurement values of the defective individual detector are corrected using measurement values of individual detectors around the defective detector in the changed basic pattern.